Atomic-force microscopy

Results: 458



#Item
351Transducers / Sensors / Electrical engineering / Systems theory / Control theory / Piezoelectricity / Piezoelectric sensor / Atomic force microscopy / Electroactive polymers / Electromagnetism / Technology / Physics

doi:[removed]j.sna[removed]

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Source URL: www.kam.k.leang.com

Language: English - Date: 2012-04-06 14:21:13
352Scientific method / Scanning probe microscopy / Intermolecular forces / Canton of Neuchâtel / Neuchâtel / Hysteresis / Atomic force microscopy / Nanosensors / AFM probe / Science / Chemistry / Nanotechnology

APPLICATION OF AN INVERSE-HYSTERESIS ITERATIVE CONTROL ALGORITHM FOR AFM FABRICATION A thesis submitted in partial fulfillment of the requirements for the degree of Master of Science in Mechanical and Nuclear Engineering

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Source URL: www.kam.k.leang.com

Language: English - Date: 2012-04-05 18:18:52
353Elasticity / Structural analysis / Solid mechanics / Continuum mechanics / Vibration isolation / Bending / Stiffness / Atomic force microscopy / Mechanism / Physics / Mechanics / Mechanical engineering

356 IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 17, NO. 2, APRIL 2012 Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner

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Source URL: www.kam.k.leang.com

Language: English - Date: 2012-04-06 14:49:23
354Scientific method / Atomic force microscopy / Piezoelectricity / Image scanner / Frequency / Physics / Science / Scanning probe microscopy

Asian Journal of Control, Vol. 11, No. 2, pp[removed], March 2009 Published online in Wiley InterScience (www.interscience.wiley.com) DOI: [removed]asjc.090 HIGH-SPEED SERIAL-KINEMATIC SPM SCANNER: DESIGN AND DRIVE CONSID

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Source URL: www.kam.k.leang.com

Language: English - Date: 2012-04-05 18:20:50
355Microscopy / Atomic force microscopy / Scanning tunneling microscope / Microscope / Magnetic force microscope / Nanotechnology / Electron microscope / Optical microscope / Gerd Binnig / Science / Scientific method / Scanning probe microscopy

Microsoft Word - SPMReference.doc

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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:35
356Microbiology / Scanning probe microscopy / Microscopes / Metrology / Confocal microscopy / Atomic force microscopy / Optical microscope / Scanning tunneling microscope / Focus variation / Scientific method / Science / Microscopy

Optical Methods of Surface Measurement Ted Vorburger, Guest Researcher National Institute of Standards and Technology (NIST)

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Source URL: www.nist.gov

Language: English - Date: 2012-07-13 15:17:10
357Electricity / Thermodynamics / Emerging technologies / Nanomaterials / Graphene / Graphite oxide / Atomic force microscopy / Thermoelectric materials / Microscope / Physics / Chemistry / Electromagnetism

SPECTRUM At Tip of Scanning Probe CAS/MPG Partner Group on Thermoelectric Systems Shanghai-Mainz, [removed] – [removed]

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Source URL: english.cas.cn

Language: English - Date: 2014-05-15 05:11:26
358Scientific method / Microscopy / Scanning electrochemical microscopy / Microscopes / Scanning tunneling microscope / Atomic force microscopy / Allen J. Bard / Science / Scanning probe microscopy / Microbiology

25 Years of Scanning Electrochemical Microscopy by David E. Cliffel and Robert L. Calhoun L

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Source URL: www.electrochem.org

Language: English - Date: 2014-07-22 12:22:00
359Chemistry / Materials science / Non-Newtonian fluids / Intermolecular forces / Atomic force microscopy / Nanoindentation / Dynamic mechanical analysis / Viscoelasticity / Dynamic modulus / Scientific method / Science / Scanning probe microscopy

ADVANCED MATERIALS AFM-Based Nanomechanics Objective Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to leverage for their uniqu

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Source URL: www.nist.gov

Language: English - Date: 2013-01-31 16:00:47
360Materials science / Nanomaterials / Intermolecular forces / Spectroscopy / Atomic force microscopy / Nanoparticle / Force spectroscopy / Colloidal gold / Vibrational analysis with scanning probe microscopy / Nanotechnology / Scanning probe microscopy / Science

NIST - NCL Joint Assay Protocol, PCC-6 Version 1.1 Size Measurement of Nanoparticles Using Atomic Force Microscopy Materials Science and Engineering Laboratory

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Source URL: ncl.cancer.gov

Language: English - Date: 2010-04-20 03:22:16
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